TOF-SIMS measurements for toxic air pollutants adsorbed on the surface of airborne particles
Tomiyasu, B; Hoshi, T; Owari, M; Nihei, Y
| HERO ID | 97837 |
|---|---|
| In Press | No |
| Year | 2003 |
| Title | TOF-SIMS measurements for toxic air pollutants adsorbed on the surface of airborne particles |
| Authors | Tomiyasu, B; Hoshi, T; Owari, M; Nihei, Y |
| Journal | Applied Surface Science |
| Volume | 203-204 |
| Page Numbers | 775-778 |
| Abstract | Three kinds of particulate matter were collected: diesel and gasoline exhaust particles emitted directly from exhaust nozzle, and suspended particulate matter (SPM) near the traffic route. Soxhlet extraction was performed on each sample. By gas-chromatograph–mass spectrometer (GC–MS) analysis of these extracts, di-ethyl phthalate and di-n-butyl phthalate were detected from the extract of SPM and diesel exhaust particles (DEPs). Because these phthalates were sometimes suspected as contamination, time-of-flight secondary ion mass spectrometry (TOF-SIMS) measurements were also performed on the samples collected at the same environment. By comparing obtained spectra, it is clear that these environmental endocrine disrupters (EEDs) were adsorbed on DEP surface. Thus, we concluded that the combination of conventional method and TOF-SIMS measurement is one of the most powerful techniques for analyzing the toxic air pollutants adsorbed on SPM surface. |
| Doi | 10.1016/S0169-4332(02)00815-2 |
| Wosid | WOS:000180527300173 |
| Url | http://www.sciencedirect.com/science/article/pii/S0169433202008152 |
| Is Certified Translation | No |
| Dupe Override | No |
| Conference Location | NARA, JAPAN |
| Conference Name | 13th International Conference on Secondary Ion Mass Spectrometry and Related Topics (SIMS XIII) |
| Comments | Source: Web of Science WOS:000180527300173 |
| Is Public | Yes |
| Language Text | English |
| Keyword | TOF-SIMS; suspended particulate matter; diesel exhaust particle; di-ethyl phthalate; di-n-butyl phthalate; environmental endocrine disrupter |
| Is Qa | No |